Binghua Lu, Selina Sha, Jincheng Wang, Zhigao Zhang, Fanjin Meng, Dragon Hsu, Rick Fisette. The test cost reduction benefits of combining a hierarchical DFT methodology with EDT channel sharing - A case study. In 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2018, Taormina, Italy, April 9-12, 2018. pages 1-4, IEEE, 2018. [doi]
Abstract is missing.