Investigation of Scaling Effect of Copper Microwire Based on in-Situ Nanorobotic Twisting Inside SEM

Haojian Lu, Fengmei Xue, Wenfeng Wan, Yajing Shen. Investigation of Scaling Effect of Copper Microwire Based on in-Situ Nanorobotic Twisting Inside SEM. In 2018 IEEE International Conference on Robotics and Automation, ICRA 2018, Brisbane, Australia, May 21-25, 2018. pages 1-9, IEEE, 2018. [doi]

Abstract

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