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Shyue-Kung Lu, Shu-Chi Yu, Chun-Lung Hsu, Chi-Tien Sun, Masaki Hashizume, Hiroyuki Yotsuyanagi. Fault-Aware Dependability Enhancement Techniques for Flash Memories. IEEE Trans. VLSI Syst., 28(3):634-645, 2020. [doi]
Abstract is missing.