Shyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume. Adaptive ECC Techniques for Yield and Reliability Enhancement of Flash Memories. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 287-292, IEEE Computer Society, 2016. [doi]
Abstract is missing.