Peng Luan, Yibang Wang, Wei Zhao, Chen Liu, Faguo Liang, Aihua Wu 0007, Jing Du. Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy. IEEE T. Instrumentation and Measurement, 69(11):8874-8880, 2020. [doi]
Abstract is missing.