Tseng-Chin Luo, Mango Chia-Tso Chao, Michael S.-Y. Wu, Kuo-Tsai Li, Chin C. Hsia, Huan-Chi Tseng, Chuen-Uan Huang, Yuan-Yao Chang, Samuel C. Pan, Konrad K.-L. Young. A novel array-based test methodology for local process variation monitoring. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-9, IEEE, 2009. [doi]
Abstract is missing.