Xiang Luo, Ya-ping Du, Xinghua Wang 0002, Mingli Chen 0002. Tripping Characteristics of Residual Current Devices under Non-Sinusoidal Currents. In Annual Meeting of the IEEE Industry Applications Society, IAS 2010, Houston, TX, USA, 3-7 October, 2010, Proceedings. pages 1-6, IEEE, 2010. [doi]
Abstract is missing.