Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu. HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting Self-Recovery and Temperature Awareness. In IEEE International Symposium on High Performance Computer Architecture, HPCA 2018, Vienna, Austria, February 24-28, 2018. pages 504-517, IEEE Computer Society, 2018. [doi]
Abstract is missing.