Wei Luo, Henri Maître. Using surface model to correct and fit disparity data in stereo vision. In 10th IAPR International Conference on Pattern Recognition, Conference A: Computer Vision & Conference B Pattern recognition systems and applications, ICPR 1990, Atlantic City, NJ, USA, 16-21 June, 1990, Volume 1. pages 60-64, IEEE, 1990. [doi]
Abstract is missing.