Lucheng Lyu, Tao Han. A Comparative Study of Chinese Patent Literature Automatic Classification Based on Deep Learning. In Maria Bonn, Dan Wu 0003, J. Stephen Downie, Alain Martaus, editors, 19th ACM/IEEE Joint Conference on Digital Libraries, JCDL 2019, Champaign, IL, USA, June 2-6, 2019. pages 345-346, IEEE, 2019. [doi]
Abstract is missing.