Beichen Lyu, Stuart D. Smith, Keith A. Cherkauer. Fine-Grained Recognition in High-throughput Phenotyping. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020. pages 320-329, IEEE, 2020. [doi]
Abstract is missing.