Lei Ma, Cyrille Artho, Cheng Zhang, Hiroyuki Sato, Johannes Gmeiner, Rudolf Ramler. GRT: Program-Analysis-Guided Random Testing (T). In Myra B. Cohen, Lars Grunske, Michael Whalen, editors, 30th IEEE/ACM International Conference on Automated Software Engineering, ASE 2015, Lincoln, NE, USA, November 9-13, 2015. pages 212-223, IEEE, 2015. [doi]
Abstract is missing.