Gradient-Based Source Mask Optimization for Extreme Ultraviolet Lithography

Xu Ma, Zhiqiang Wang, Xuanbo Chen, Yanqiu Li, Gonzalo R. Arce. Gradient-Based Source Mask Optimization for Extreme Ultraviolet Lithography. IEEE Trans. Computational Imaging, 5(1):120-135, 2019. [doi]

Abstract

Abstract is missing.