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Temperature dependence of the interface state distribution due to hot carrier effect in FinFET device

Chenyue Ma, Hao Wang, Chenfei Zhang, Xiufang Zhang, Jin He, Xing Zhang. Temperature dependence of the interface state distribution due to hot carrier effect in FinFET device. Microelectronics Reliability, 50(8):1077-1080, 2010. [doi]

Authors

Chenyue Ma

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Hao Wang

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Chenfei Zhang

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Xiufang Zhang

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Jin He

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Xing Zhang

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