Hierarchical characterization procedures for dimensional metrology

David K. MacKinnon, Jean-Angelo Beraldin, Luc Cournoyer, Benjamin Carrier. Hierarchical characterization procedures for dimensional metrology. In J.-Angelo Beraldin, Geraldine S. Cheok, Michael B. McCarthy, Ulrich Neuschaefer-Rube, Atilla Baskurt, Ian E. McDowall, Margaret Dolinsky, editors, Three-Dimensional Imaging, Interaction, and Measurement, San Francisco Airport, California, USA, January 24-27, 2011. Volume 7864 of SPIE Proceedings, pages 786402, SPIE, 2011. [doi]

@inproceedings{MacKinnonBCC11,
  title = {Hierarchical characterization procedures for dimensional metrology},
  author = {David K. MacKinnon and Jean-Angelo Beraldin and Luc Cournoyer and Benjamin Carrier},
  year = {2011},
  doi = {10.1117/12.872124},
  url = {http://dx.doi.org/10.1117/12.872124},
  researchr = {https://researchr.org/publication/MacKinnonBCC11},
  cites = {0},
  citedby = {0},
  pages = {786402},
  booktitle = {Three-Dimensional Imaging, Interaction, and Measurement, San Francisco Airport, California, USA, January 24-27, 2011},
  editor = {J.-Angelo Beraldin and Geraldine S. Cheok and Michael B. McCarthy and Ulrich Neuschaefer-Rube and Atilla Baskurt and Ian E. McDowall and Margaret Dolinsky},
  volume = {7864},
  series = {SPIE Proceedings},
  publisher = {SPIE},
  isbn = {978-0-8194-8401-7},
}