Takashi Machida, Haruo Takemura, Naokazu Yokoya. Dense estimation of surface reflectance parameters from registered range and color images by determining illumination conditions. In Brian D. Corner, Joseph H. Nurre, Roy P. Pargas, editors, Proceedings of the Conference on Three-Dimensional Image Capture and Applications IV, San Jose, CA, USA, January 20, 2001. Volume 4298 of SPIE Proceedings, pages 127-134, SPIE, 2001. [doi]
Abstract is missing.