Maxime Madau, Michel Agoyan, Josep Balasch, Milos Grujic, Patrick Haddad, Philippe Maurine, Vladimir Rozic, Dave Singelée, Bohan Yang 0001, Ingrid Verbauwhede. The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators. In 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2018, Amsterdam, The Netherlands, September 13, 2018. pages 43-48, IEEE Computer Society, 2018. [doi]
Abstract is missing.