Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS - researchr publication authors

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Roel Maes, Vladimir Rozic, Ingrid Verbauwhede, Patrick Koeberl, Erik van der Sluis, Vincent van der Leest. Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS. In Proceedings of the 38th European Solid-State Circuit conference, ESSCIRC 2012, Bordeaux, France, September 17-21, 2012. pages 486-489, IEEE, 2012. [doi]

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