Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment

Swaraj Mahato, Georges G. E. Gielen. Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment. In 20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013. pages 413-416, IEEE, 2013. [doi]

Abstract

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