Swaraj Mahato, J. De Ridder, Guy Meynants, Gert Raskin, Hans Van Winckel. A novel technique to characterize the spatial intra-pixel sensitivity variations in a CMOS image sensor. In 15th IEEE International New Circuits and Systems Conference, NEWCAS 2017, Strasbourg, France, June 25-28, 2017. pages 361-364, IEEE, 2017. [doi]
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