Offset measurement method for accurate characterization of BTI-induced degradation in opamps

Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen. Offset measurement method for accurate characterization of BTI-induced degradation in opamps. In 19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012. pages 661-664, IEEE, 2012. [doi]

Abstract

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