Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits - researchr publication

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Atul Maheshwari, Israel Koren, Wayne Burleson. Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 597, IEEE Computer Society, 2003. [doi]

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