Design Framework to Overcome Aging Degradation of the 16 nm VLSI Technology Circuits

Mohamed Mounir Mahmoud, Norhayati Soin, Hossam A. H. Fahmy. Design Framework to Overcome Aging Degradation of the 16 nm VLSI Technology Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(5):691-703, 2014. [doi]

Abstract

Abstract is missing.