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An Improved CMOS BICS for On-Line Testing

Y. Maidon, Yann Deval, Jean-Baptiste Begueret. An Improved CMOS BICS for On-Line Testing. In 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain. pages 100, IEEE Computer Society, 2000. [doi]

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