Online test vector insertion: A concurrent built-in self-testing (CBIST) approach for asynchronous logic

J. Maier, Andreas Steininger. Online test vector insertion: A concurrent built-in self-testing (CBIST) approach for asynchronous logic. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014. pages 33-38, IEEE, 2014. [doi]

Abstract

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