Electromagnetic analysis and fault injection onto secure circuits

Paolo Maistri, RĂ©gis Leveugle, Lilian Bossuet, A. Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart. Electromagnetic analysis and fault injection onto secure circuits. In Lorena Garcia, editor, 22nd International Conference on Very Large Scale Integration, VLSI-SoC, Playa del Carmen, Mexico, October 6-8, 2014. pages 1-6, IEEE, 2014. [doi]

Abstract

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