Electromagnetic security tests for SoC

Fabien Majéric, Eric Bourbao, Lilian Bossuet. Electromagnetic security tests for SoC. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 265-268, IEEE, 2016. [doi]

Abstract

Abstract is missing.