Subhashis Majumder, Michael L. Bushnell, Vishwani D. Agrawal. Path Delay Testing: Variable-Clock Versus Rated-Clock. In 11th International Conference on VLSI Design (VLSI Design 1991), 4-7 January 1998, Chennai, India. pages 470-475, IEEE Computer Society, 1998. [doi]
Abstract is missing.