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Subhashis Majumder, Bhargab B. Bhattacharya, Vishwani D. Agrawal, Michael L. Bushnell. A New Classification of Path-Delay Fault Testability in Terms of Stuck-at Faults. J. Comput. Sci. Technol., 19(6):955-964, 2004. [doi]
Abstract is missing.