T. M. Mak, Debika Bhattacharya, Cheryl Prunty, Bob Roeder, Nermine Ramadan, Joel Ferguson, Jianlin Yu. Cache RAM inductive fault analysis with fab defect modeling. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 862-871, IEEE Computer Society, 1998. [doi]
Abstract is missing.