ATPG for scan chain latches and flip-flops

Samy Makar, Edward J. McCluskey. ATPG for scan chain latches and flip-flops. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 364-369, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.