Characterization of Germanium Nanocrystallites Grown on SiO::2:: by a Conductive AFM Probe Technique - researchr publication

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Katsunori Makihara, Yoshihiro Okamoto, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. Characterization of Germanium Nanocrystallites Grown on SiO::2:: by a Conductive AFM Probe Technique. IEICE Transactions, 88-C(4):705-708, 2005. [doi]

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