Rafic Z. Makki, Shyang-Tai Su, Troy Nagle. Transient Power Supply Current Testing of Digital CMOS Circuits. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 892-901, IEEE Computer Society, 1995.
@inproceedings{MakkiSN95,
title = {Transient Power Supply Current Testing of Digital CMOS Circuits},
author = {Rafic Z. Makki and Shyang-Tai Su and Troy Nagle},
year = {1995},
tags = {testing},
researchr = {https://researchr.org/publication/MakkiSN95},
cites = {0},
citedby = {0},
pages = {892-901},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}