Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich, Bob Skibbe. The relationship between test coverage and reliability. In 5th International Symposium on Software Reliability Engineering, ISSRE 1994, Monterey, CA, USA, November 6-9, 1994. pages 186-195, IEEE, 1994. [doi]
Abstract is missing.