Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner. Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 67-72, IEEE Computer Society, 2009. [doi]
Abstract is missing.