Lidar waveform modeling using a marked point process

Clément Mallet, Florent Lafarge, Frédéric Bretar, Uwe Soergel, Christian Heipke. Lidar waveform modeling using a marked point process. In Proceedings of the International Conference on Image Processing, ICIP 2009, 7-10 November 2009, Cairo, Egypt. pages 1713-1716, IEEE, 2009. [doi]

Abstract

Abstract is missing.