Uncertainty in multiple penetration depth fringing electric field sensor measurements

Alexander V. Mamishev, Shane R. Cantrell, Yanqing Du, Bernard C. Lesieutre, Markus Zahn. Uncertainty in multiple penetration depth fringing electric field sensor measurements. IEEE T. Instrumentation and Measurement, 51(6):1192-1199, 2002. [doi]

Abstract

Abstract is missing.