David Mandelin, Doug Kimelman, Daniel M. Yellin. A Bayesian approach to diagram matching with application to architectural models. In Leon J. Osterweil, H. Dieter Rombach, Mary Lou Soffa, editors, 28th International Conference on Software Engineering (ICSE 2006), Shanghai, China, May 20-28, 2006. pages 222-231, ACM, 2006. [doi]
Abstract is missing.