A New Statistical Optimization Algorithm for Gate Sizing

Murari Mani, Michael Orshansky. A New Statistical Optimization Algorithm for Gate Sizing. In 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings. pages 272-277, IEEE Computer Society, 2004. [doi]

Abstract

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