Murari Mani, Ashish Kumar Singh, Michael Orshansky. Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 19-26, ACM, 2006. [doi]
Abstract is missing.