Deepa Mannath, Dallas Webster, Victor Montaño-Martinez, David Cohen, Shai Kush, Ganesan Thiagarajan, Adesh Sontakke. Structural approach for built-in tests in RF devices. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 398-404, IEEE, 2010. [doi]
Abstract is missing.