An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications

Elie Maricau, P. De Wit, Georges G. E. Gielen. An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications. Microelectronics Reliability, 48(8-9):1576-1580, 2008. [doi]

Abstract

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