Applying a Functional Size Measurement Procedure for Defect Detection in MDD Environments

Beatriz Marín, Giovanni Giachetti, Oscar Pastor. Applying a Functional Size Measurement Procedure for Defect Detection in MDD Environments. In Rory V. O'Connor, Nathan Baddoo, Juan Cuadrago Gallego, Ricardo J. Rejas-Muslera, Kari Smolander, Richard Messnarz, editors, Software Process Improvement - 16th European Conference, EuroSPI 2009, Alcala (Madrid), Spain, September 2-4, 2009. Proceedings. Volume 42 of Communications in Computer and Information Science, pages 57-68, Springer, 2009. [doi]

Authors

Beatriz Marín

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Giovanni Giachetti

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Oscar Pastor

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