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Challenges in Embedded Memory Design and Test

Erik Jan Marinissen, Betty Prince, Doris Keitel-Schulz, Yervant Zorian. Challenges in Embedded Memory Design and Test. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 722-727, IEEE Computer Society, 2005. [doi]

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