IoT: Source of test challenges

Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang 0001, Dave Singelée, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes. IoT: Source of test challenges. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-10, IEEE, 2016. [doi]

Abstract

Abstract is missing.