Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays - researchr publication authors

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Viktor Markov, Gilles Festes, Louisa Schneider, Steven Lemke, Serguei Jourba, Alexander Kotov. Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays. In IEEE International Memory Workshop, IMW 2023, Monterey, CA, USA, May 21-24, 2023. pages 1-4, IEEE, 2023. [doi]

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