Viktor Markov, Gilles Festes, Louisa Schneider, Steven Lemke, Serguei Jourba, Alexander Kotov. Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays. In IEEE International Memory Workshop, IMW 2023, Monterey, CA, USA, May 21-24, 2023. pages 1-4, IEEE, 2023. [doi]
@inproceedings{MarkovFSLJK23,
title = {Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays},
author = {Viktor Markov and Gilles Festes and Louisa Schneider and Steven Lemke and Serguei Jourba and Alexander Kotov},
year = {2023},
doi = {10.1109/IMW56887.2023.10145950},
url = {https://doi.org/10.1109/IMW56887.2023.10145950},
researchr = {https://researchr.org/publication/MarkovFSLJK23},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Memory Workshop, IMW 2023, Monterey, CA, USA, May 21-24, 2023},
publisher = {IEEE},
isbn = {978-1-6654-7459-7},
}