Shortening the gap between pre- and post-layout analog IC performance by reducing the LDE-induced variations with multi-objective simulated quantum annealing

Ricardo Martins 0003, Nuno Lourenço 0003, Ricardo Póvoa, Nuno Horta. Shortening the gap between pre- and post-layout analog IC performance by reducing the LDE-induced variations with multi-objective simulated quantum annealing. Eng. Appl. of AI, 98:104102, 2021. [doi]

Abstract

Abstract is missing.