Fabrication and Testing of Single Photon Avalanche Detectors in the TSMC 0.18µm CMOS Technology

Miriam Adlerstein Marwick, Andreas G. Andreou. Fabrication and Testing of Single Photon Avalanche Detectors in the TSMC 0.18µm CMOS Technology. In Proceedings of the 41st Annual Conference on Information Sciences and Systems, CISS 2007, 14-16 March 2007, Johns Hopkins University, Department of Electrical Engineering, Baltimore, MD, USA. pages 741-744, IEEE, 2007. [doi]

Abstract

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