Metric Learning for Novelty and Anomaly Detection

Marc Masana, Idoia Ruiz, Joan Serrat, Joost van de Weijer, Antonio M. López. Metric Learning for Novelty and Anomaly Detection. In British Machine Vision Conference 2018, BMVC 2018, Northumbria University, Newcastle, UK, September 3-6, 2018. pages 64, BMVA Press, 2018. [doi]

Authors

Marc Masana

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Idoia Ruiz

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Joan Serrat

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Joost van de Weijer

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Antonio M. López

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